The influence of temperature on optical, structural and morphological properties of copper hexadecafluoro phthalocyanine (F16CuPc) thin films

Nizammesrasuria, Nur Afiqah (2022) The influence of temperature on optical, structural and morphological properties of copper hexadecafluoro phthalocyanine (F16CuPc) thin films. [Project Paper] (Submitted)

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Abstract

In this study, a metal phthalocyanine (MPc), copper hexadecafluoro phthalocyanine (F16CuPc) thin films are deposited and studied to observe the effects of thermal annealing on them. This study is done to identify the optical, structural and morphological properties of F16CuPc thin films by varying thermal annealing. F16CuPc thin films have been deposited on glass substrates using thermal evaporation method and are annealed to 50 °C, 100 °C, and 200 °C. Using UV-Vis-NIR spectrometer, the results show that F16CuPc thin films are well absorbing in the ultraviolet (UV) and visible (Vis) range, with two sharp peaks at 360 nm and 789 nm with a shoulder at 650 nm, corresponds to π-π∗ transitions, respectively. This study proves no significant effect on varied temperature for optical properties of F16CuPc thin films. The F16CuPc thin films are suitable for light sensing application as they presented a high extinction coefficient in the Vis region. The optical band gap energy, Eg gained from the Tauc’s equation is (3.04 ± 0.01) eV, which is close enough to the value gained by extrapolating the plot of absorbance to the horizontal axis, 2.97 eV. Structural properties are also studied using (X-ray Diffraction) XRD analysis, which shows the F16CuPc powder is in the crystallized phase. However, the study depicts an amorphous phase for annealed F16CuPc thin films, which contradicts to the previous researches. This is due to low optimization during the deposition process since there is no indicator to indicate the deposition rate and the distance between the source and substrates. Despite the failure to get the expected result for the structural properties, the morphological properties of F16CuPc thin films by Atomic Force Microscopy (AFM) show that the surface’s roughness increases as the annealing temperature increases. The effects of thermal annealing on optical, structural and morphological properties of F16CuPc thin films are explained in this work.

Item Type:	Project Paper
Faculty:	Fakulti Sains
Depositing User:	Ms. ROHANA ALIAS
Date Deposited:	05 Jun 2024 23:30
Last Modified:	05 Aug 2024 09:04
URI:	http://psaspb.upm.edu.my/id/eprint/1894

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